7.2.2. Component and Target Metrology

Component and Target Metrology

Throughout the fabrication process, engineers inspect the target materials and components using nondestructive characterization methods to ensure that target specifications are met and that all components are free of defects. Several GA laboratories are set up and equipped to carry out precision characterization of target components (TMP components, LEH components, keyhole cones, mirrors, mandrels, capsules, hohlraums, and subassemblies). LLNL has a suite of materials characterization techniques that have been applied to metrology and characterization of the fully assembled targets. LLNL and GA are regularly developing new characterization capabilities to meet customer needs. See Appendix F for a list of LLNL and GA characterization capabilities.